Agentic AI Automates X-Ray Inspection

Executive Briefing & Key Highlights

Agentic AI can now guide X-ray scans of microelectronics using natural-language instructions, combining real-time image reconstruction, autonomous navigation, and AI-based feature segmentation. Researchers at Argonne National Laboratory have demonstrated an agentic AI system that can autonomously guide X-ray imaging of microelectronics, potentially changing how semiconductor devices are inspected