Semiconductor Engineering#Semiconductor
HW Information-Flow Tracking for Pre-Silicon Security Testing (Princeton, MIT, EPFL)
BerojgarDegreeWala Editorial11 September 2026
Semiconductor Engineering11 September 2026
HW Information-Flow Tracking for Pre-Silicon Security Testing (Princeton, MIT, EPFL)
Original Publication
Semiconductor Engineering
Executive Briefing & Key Highlights
Researchers at Princeton University, MIT CSAIL, and EPFL published a technical paper titled “Efficient Hardware Information-Flow Tracking for Pre-Silicon Security Testing.” Abstract “Register-Transfer Level (RTL) simulation is widely used to test hardware before it is fabricated. To allow testing for security related information flow properties, such as confidentiality and integrity, taint logic c
Topics:SemiconductorElectronicsSemiconductor Engineering
